Research output per year
Research output per year
Search results
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2024
Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures
Moyo, A., Shahzad, M. W., Smith, S., Terry, J., Mita, Y., Lewis, J. & Li, Y., 10 May 2024, 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS). Piscataway, US: IEEE, 5 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile26 Downloads (Pure) -
2023
Test Structures for Studying Coplanar Reverse- Electrowetting for Vibration Sensing and Energy Harvesting
Moyo, A., Shahzad, M. W., Terry, J. G., Smith, S., Yoshio, M. & Li, Y., 27 Mar 2023, 2023 35th International Conference on Microelectronic Test Structure, ICMTS 2023. Piscataway, US: IEEE, p. 27-30 4 p. (International Conference on Microelectronic Test Structure (ICMTS)).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile2 Citations (Scopus)26 Downloads (Pure) -
2022
A facile coplanar reverse electrowetting-ondielectric configuration for more flexible and integratable force/motion sensing applications
Moyo, A., Shahzad, M. W., Terry, J., Yoshio, M. & Li, Y., 30 Oct 2022, Sensors 2022: Conference proceedings. Piscataway, US: IEEE, p. 1-5 5 p. (Proceedings of IEEE Sensors; vol. 2022-October).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile3 Citations (Scopus)45 Downloads (Pure) -
2021
A tunable morphing polyelectrolyte system for smart ocular applications
Sun, A., Sridhar, S., Chen, S., Li, Y. & Xu, B. B., 20 Jun 2021, 21st International Conference on Solid-State Sensors, Actuators and Microsystems, TRANSDUCERS 2021. Piscataway, NJ: IEEE, p. 1464-1467 4 p. B5-550lResearch output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile65 Downloads (Pure) -
2020
Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures
Schmueser, I., Blair, E., Isiksacan, Z., Li, Y., Corrigan, D., Stokes, A., Terry, J., Mount, A. & Walton, A., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile31 Downloads (Pure) -
2019
Advanced 3D morphing transducers by smart hydrogel patterning
Wang, C., Sridhar, S., Terry, J., Sun, A., Li, Z., Lu, H., Xu, B. B. & Li, Y., 1 Jun 2019, 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems and Eurosensors XXXIII, TRANSDUCERS 2019 and EUROSENSORS XXXIII: 23-27 June 2019, Berlin, Germany. Piscataway, NJ: IEEE, p. 2508-2510 3 p. 8808453Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile37 Downloads (Pure) -
2018
Metal-Elastomer Surface Deformation Control on Super-Compressible Strain Transducer Arrays
Wang, C., Xu, B., Terry, J., Smith, S., Walton, A. & Li, Y., 8 Aug 2018, IEEE International Flexible Electronics Technology Conference. Piscataway: IEEEResearch output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile45 Downloads (Pure) -
2017
Polydimethylsiloxane (PDMS)-based microfluidic channel with integrated commercial pressure sensors
Dover, C. M. M., Li, Y., Korniliou, S., Sefiane, K., Terry, J. G. & Walton, A. J., 21 Dec 2017, IEEE SENSORS 2017 - Conference Proceedings. IEEE (ed.). Piscataway: Institute of Electrical and Electronics Engineers Inc., p. 1-3 3 p. 17467283. (Proceedings of IEEE Sensors; vol. 2017-December).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile1 Citation (Scopus)30 Downloads (Pure) -
2008
Test structure for characterising low voltage coplanar EWOD system
Li, Y., Yoshio, M., Haworth, L., Parkes, W., Kubota, M. & Walton, A., 15 Sept 2008, 2008 IEEE Conference on Microelectronic Test Structures, ICMTS. p. 80-85 6 p. 4509318. (IEEE International Conference on Microelectronic Test Structures).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Citations (Scopus)