TY - JOUR
T1 - A Novel Multispectral Fusion Defect Detection Framework With Coarse-to-Fine Multispectral Registration
AU - Li, Jiacheng
AU - Gao, Bin
AU - Woo, Wai Lok
AU - Xu, Jieyi
AU - Liu, Lei
AU - Zeng, Yu
N1 - Funding information: This work was supported in part by the National Natural
Science Foundation of China under Grant 61971093, Grant 61960206010, and
Grant 61527803; and in part by the Science and Technology Research Project
of Pipechina under Grant WZXGL202104
PY - 2024/1/2
Y1 - 2024/1/2
N2 - This article introduces a new imaging approach to nondestructive defect detection by combining visual testing (VT) and infrared thermal testing (IRT) in a multispectral vision sensing fusion system. The goal is to overcome the hampering challenges faced by traditional imaging methods, including complex environments, irregular samples, various defect types, and the need for efficient detection. The proposed system simultaneously detects and classifies surface and subsurface defects, addressing issues, such as false detection due to changes in surface emissivity in IRT and the inability to detect subsurface defects in VT. A novel multispectral fusion defect detection framework is proposed, employing coarse-to-fine multispectral registration for accurate alignment of infrared and visible images with different resolutions and fields of view. Domain adaptation unifies the feature domains of infrared and visible images by replacing the phase components in the frequency domain. The framework utilizes the complementary information from infrared and visible modalities to enhance detection accuracy and robustness. Experimental validation is conducted on different specimens, confirming the effectiveness of the proposed framework in detecting and generalizing to various shapes and materials. Overall, this article presents a novel imaging system that combines VT and IRT, offering improved detection capabilities in complex environments and diverse defect scenarios. The demo code is available at: https://github.com/ljcuestc/YoloMultispectralFusion-Coarse-to-fine-Registration.gi .
AB - This article introduces a new imaging approach to nondestructive defect detection by combining visual testing (VT) and infrared thermal testing (IRT) in a multispectral vision sensing fusion system. The goal is to overcome the hampering challenges faced by traditional imaging methods, including complex environments, irregular samples, various defect types, and the need for efficient detection. The proposed system simultaneously detects and classifies surface and subsurface defects, addressing issues, such as false detection due to changes in surface emissivity in IRT and the inability to detect subsurface defects in VT. A novel multispectral fusion defect detection framework is proposed, employing coarse-to-fine multispectral registration for accurate alignment of infrared and visible images with different resolutions and fields of view. Domain adaptation unifies the feature domains of infrared and visible images by replacing the phase components in the frequency domain. The framework utilizes the complementary information from infrared and visible modalities to enhance detection accuracy and robustness. Experimental validation is conducted on different specimens, confirming the effectiveness of the proposed framework in detecting and generalizing to various shapes and materials. Overall, this article presents a novel imaging system that combines VT and IRT, offering improved detection capabilities in complex environments and diverse defect scenarios. The demo code is available at: https://github.com/ljcuestc/YoloMultispectralFusion-Coarse-to-fine-Registration.gi .
KW - Coarse-to-fine image registration
KW - defect detection
KW - late fusion
KW - multimodal
KW - multispectral fusion
UR - http://www.scopus.com/inward/record.url?scp=85181849435&partnerID=8YFLogxK
U2 - 10.1109/tim.2023.3344145
DO - 10.1109/tim.2023.3344145
M3 - Article
SN - 0018-9456
VL - 73
SP - 1
EP - 13
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
M1 - 5005313
ER -