TY - JOUR
T1 - A Review on Scattering Techniques for Analysis of Nanomaterials and Biomaterials
AU - Prasad, Rai Dhirendra
AU - Prasad, Neeraj R.
AU - Prasad, Nirmala
AU - Prasad, Saurabh R.
AU - Prasad, Rai Surendra
AU - Prasad, Rai Bishvendra
AU - Prasad, Rai Rajnarayan
AU - Prasad, Rai Girindra
AU - Desai, C. B.
AU - Vaidya, Anil Kumar
AU - Shaikh, Y. I.
AU - Nazeruddin, G. M.
AU - Shaikh, Viquar
AU - Pande, R. S.
AU - Mamidpelliwar, P. M.
AU - Deshmukh, R. N.
AU - Patil, V. N.
AU - Samant, Anant
AU - Chiplunkar, Chandrashekhar
AU - Guo, Zhanhu
AU - Sarvalkar, Prashant
AU - Ramteke, A. A.
AU - Shaikh, Arif D.
N1 - Publisher Copyright:
© The Author(s) 2025.
PY - 2025/2/1
Y1 - 2025/2/1
N2 - Nanomaterials and biomaterials are becoming increasingly important in current scientific and industrial communities. Nanomaterials are beyond the perception of the human eye. Thus, to determine the structure, morphology, and exact formation of materials on the nanoscale, an authentic technique is required. Recently, attempts have been made to determine the structure of materials at the nanoscale level. With the progress of time and advancements in scientific knowledge, the method of characterization has changed. Nanomaterial characterization techniques can be broadly classified into three main types: (1) spectroscopic, (2) microscopic, and (3) Scattering Techniques. Scattering techniques are very important and act as confirmatory techniques for determining the structure of materials at the nanoscale. Furthermore, most of the scattering is non-destructive, that is, the samples can be recovered after analysis. Considering the importance of the technique and its versatile utility, an attempt has been made to discuss various characterization techniques used for the analysis of materials at the nanoscale. We have discussed the working principles, applications, and limitations of various characterization techniques such as X-ray diffraction (XRD), small-angle X-ray scattering (SAXS), neutron scattering, dynamic light scattering (DLS), and electron microscopy. We have discussed each characterization technique in detail, highlighting the strength of the technique, its limitations, and recent developments in particular characterization with data analysis. Furthermore, this review examines the specific applications of scattering techniques in the characterization of nanomaterials, such as nanoparticles, nanocomposites, and nanostructured surfaces, and in the analysis of biomaterials, including proteins, nucleic acids, and lipid membranes. The role of scattering techniques in elucidating the structural properties, morphology, size distribution, and interactions of these materials has been thoroughly investigated. In the last section of this review, we discuss the future possibilities for further improvements and applications of various characterization techniques. The scientific community will obtain in detail information about characterization techniques through a single review paper. Scattering techniques find numerous applications in various sectors such as in structure determination, material characterization, particle size analysis, thin film analysis, protein structure determination, cell membrane studies, cancer research, drug formulation, quality control, fingerprints and DNA analysis, etc.
AB - Nanomaterials and biomaterials are becoming increasingly important in current scientific and industrial communities. Nanomaterials are beyond the perception of the human eye. Thus, to determine the structure, morphology, and exact formation of materials on the nanoscale, an authentic technique is required. Recently, attempts have been made to determine the structure of materials at the nanoscale level. With the progress of time and advancements in scientific knowledge, the method of characterization has changed. Nanomaterial characterization techniques can be broadly classified into three main types: (1) spectroscopic, (2) microscopic, and (3) Scattering Techniques. Scattering techniques are very important and act as confirmatory techniques for determining the structure of materials at the nanoscale. Furthermore, most of the scattering is non-destructive, that is, the samples can be recovered after analysis. Considering the importance of the technique and its versatile utility, an attempt has been made to discuss various characterization techniques used for the analysis of materials at the nanoscale. We have discussed the working principles, applications, and limitations of various characterization techniques such as X-ray diffraction (XRD), small-angle X-ray scattering (SAXS), neutron scattering, dynamic light scattering (DLS), and electron microscopy. We have discussed each characterization technique in detail, highlighting the strength of the technique, its limitations, and recent developments in particular characterization with data analysis. Furthermore, this review examines the specific applications of scattering techniques in the characterization of nanomaterials, such as nanoparticles, nanocomposites, and nanostructured surfaces, and in the analysis of biomaterials, including proteins, nucleic acids, and lipid membranes. The role of scattering techniques in elucidating the structural properties, morphology, size distribution, and interactions of these materials has been thoroughly investigated. In the last section of this review, we discuss the future possibilities for further improvements and applications of various characterization techniques. The scientific community will obtain in detail information about characterization techniques through a single review paper. Scattering techniques find numerous applications in various sectors such as in structure determination, material characterization, particle size analysis, thin film analysis, protein structure determination, cell membrane studies, cancer research, drug formulation, quality control, fingerprints and DNA analysis, etc.
KW - Applications
KW - Electron Scattering Techniques
KW - Light Scattering Techniques
KW - Limitations
KW - Nanomaterials Characterization
KW - Neutron Scattering Techniques
UR - http://www.scopus.com/inward/record.url?scp=85215692384&partnerID=8YFLogxK
U2 - 10.30919/es1332
DO - 10.30919/es1332
M3 - Review article
AN - SCOPUS:85215692384
SN - 2576-988X
VL - 33
JO - Engineered Science
JF - Engineered Science
M1 - 1332
ER -