TY - JOUR
T1 - A Review on Thin Film Technology and Nanomaterial Characterization Techniques
AU - Prasad, Rai Dhirendra
AU - Teli, Shivanand B.
AU - Prasad, Rai Surendra
AU - Prasad, Rai Bishvendra
AU - Prasad, Saurabh R.
AU - Sinha, Pramode
AU - Sinha, Amit
AU - Sinha, Preety
AU - Saxena, Mamata
AU - Prasad, Rai Rajnarayan
AU - Pande, R. S.
AU - Charmode, Naresh
AU - Deshmukh, K. G.
AU - Sarvalkar, Prashant D.
AU - Kadam, U. D.
AU - Chiplunkar, Chandrasekhar
AU - Prasad, Nirmala
AU - Padvi, M. V.
AU - Guo, Zhanhu
PY - 2024/9/1
Y1 - 2024/9/1
N2 - Over the last 200 years, there has been an increase in the process of depositing thin film materials, which has been considerably developing. A good understanding of the various deposition methods and processes is necessary to improve the desired film thickness and characteristics. The purpose of this review paper is to display the critical analysis of existing thin film deposition methods. The paper discusses some important thin film techniques that are advanced and suitable for the analysis of thin films. Nanomaterials are invisible and require various advanced characterization to investigate their physical and chemical properties. Therefore, it becomes essential to determine these properties: there is a need for advanced scientific tools for the analysis of nanomaterials and thin films. A comprehensive list of fundamentals of thin film technology, including deposition, structure, film properties, advanced characterization tools and applications are presented together.
AB - Over the last 200 years, there has been an increase in the process of depositing thin film materials, which has been considerably developing. A good understanding of the various deposition methods and processes is necessary to improve the desired film thickness and characteristics. The purpose of this review paper is to display the critical analysis of existing thin film deposition methods. The paper discusses some important thin film techniques that are advanced and suitable for the analysis of thin films. Nanomaterials are invisible and require various advanced characterization to investigate their physical and chemical properties. Therefore, it becomes essential to determine these properties: there is a need for advanced scientific tools for the analysis of nanomaterials and thin films. A comprehensive list of fundamentals of thin film technology, including deposition, structure, film properties, advanced characterization tools and applications are presented together.
KW - Applications
KW - Characterization tools
KW - Deposition techniques
KW - Electrical properties
KW - Nanomaterials
KW - Optical properties, mechanical properties
KW - Thin Films
UR - http://www.scopus.com/inward/record.url?scp=85207112848&partnerID=8YFLogxK
U2 - 10.30919/esmm1198
DO - 10.30919/esmm1198
M3 - Review article
AN - SCOPUS:85207112848
SN - 2578-0611
VL - 25
JO - ES Materials and Manufacturing
JF - ES Materials and Manufacturing
M1 - 1198
ER -