Abstract
The choice of metals suitable as the reflective substrate electrode for top-illuminated organic photovoltaics (OPVs) is extremely limited. Herein, we report a novel substrate electrode for this class of OPV architecture based on an Al|Cu|AlOx triple-layer structure, which offers a reflectivity comparable to that of Al over the wavelength range 400-900 nm, a work function suitable for efficient electron extraction in OPVs and high stability towards oxidation. In addition to demonstrating the advantage of this composite electrode over Al in model top-illuminated OPVs, we also present the results of a photoelectron spectroscopy study, which show that an oxidised 0.8 nm Al layer deposited by thermal evaporation onto an Al|Cu reflective substrate electrode is sufficient to block oxidation of the underlying Cu by air or during deposition of a ZnO1-x electron-transport layer. This is remarkable given that the self-limiting oxide thickness on Al metal is greater than 2 nm.
| Original language | English |
|---|---|
| Pages (from-to) | 1203-1209 |
| Number of pages | 7 |
| Journal | ChemPhysChem |
| Volume | 16 |
| Issue number | 6 |
| Early online date | 18 Feb 2015 |
| DOIs | |
| Publication status | Published - 27 Apr 2015 |
| Externally published | Yes |
Keywords
- aluminum
- copper
- organic photovoltaics
- photoelectron spectroscopy
- reflective electrodes