An investigation into the effects of pattern geometries on laser trimmed film resistors

Maria Alafogianni; Martin Birkett; Roger Penlington

doi:10.1109/ICSAE.2016.7810165

An investigation into the effects of pattern geometries on laser trimmed film resistors

Maria Alafogianni, Martin Birkett, Roger Penlington

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

3 Citations (Scopus)

Abstract

This study investigates the influence of different trim patterns on the performance of laser trimmed film resistors. A variety of popular trim pattern geometries including the plunge and L-cut were modelled and tested and their effect on resistance value, temperature coefficient of resistance (TCR) and heat-affected-zone (HAZ) sensitivity was investigated. It is shown that variation in resistor dimensions and trim length in the trimming algorithm can increase the TCR of the resistors with results of 100–140 ppm/°C for the plunge cut and 100–130 ppm/°C for the L-cut. It is also found that the L-cut has lower sensitivity in the HAZ with a value of 11% in comparison with the plunge cut with a value of 12% for the same resistor dimensions.

Original language	English
Title of host publication	Proceedings of the 2016 International Conference for Students on Applied Engineering (ISCAE)
Place of Publication	Piscataway
Publisher	IEEE
Pages	79-82
ISBN (Print)	978-1-4673-9053-8
DOIs	https://doi.org/10.1109/ICSAE.2016.7810165
Publication status	Published - 9 Jan 2017

Keywords

optimization
laser trimming process
thin film resistors
heat-affected-zone
TCR

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10.1109/ICSAE.2016.7810165

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abstract = "This study investigates the influence of different trim patterns on the performance of laser trimmed film resistors. A variety of popular trim pattern geometries including the plunge and L-cut were modelled and tested and their effect on resistance value, temperature coefficient of resistance (TCR) and heat-affected-zone (HAZ) sensitivity was investigated. It is shown that variation in resistor dimensions and trim length in the trimming algorithm can increase the TCR of the resistors with results of 100–140 ppm/°C for the plunge cut and 100–130 ppm/°C for the L-cut. It is also found that the L-cut has lower sensitivity in the HAZ with a value of 11% in comparison with the plunge cut with a value of 12% for the same resistor dimensions.",

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T1 - An investigation into the effects of pattern geometries on laser trimmed film resistors

AU - Alafogianni, Maria

AU - Birkett, Martin

AU - Penlington, Roger

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N2 - This study investigates the influence of different trim patterns on the performance of laser trimmed film resistors. A variety of popular trim pattern geometries including the plunge and L-cut were modelled and tested and their effect on resistance value, temperature coefficient of resistance (TCR) and heat-affected-zone (HAZ) sensitivity was investigated. It is shown that variation in resistor dimensions and trim length in the trimming algorithm can increase the TCR of the resistors with results of 100–140 ppm/°C for the plunge cut and 100–130 ppm/°C for the L-cut. It is also found that the L-cut has lower sensitivity in the HAZ with a value of 11% in comparison with the plunge cut with a value of 12% for the same resistor dimensions.

AB - This study investigates the influence of different trim patterns on the performance of laser trimmed film resistors. A variety of popular trim pattern geometries including the plunge and L-cut were modelled and tested and their effect on resistance value, temperature coefficient of resistance (TCR) and heat-affected-zone (HAZ) sensitivity was investigated. It is shown that variation in resistor dimensions and trim length in the trimming algorithm can increase the TCR of the resistors with results of 100–140 ppm/°C for the plunge cut and 100–130 ppm/°C for the L-cut. It is also found that the L-cut has lower sensitivity in the HAZ with a value of 11% in comparison with the plunge cut with a value of 12% for the same resistor dimensions.

KW - optimization

KW - laser trimming process

KW - thin film resistors

KW - heat-affected-zone

KW - TCR

U2 - 10.1109/ICSAE.2016.7810165

DO - 10.1109/ICSAE.2016.7810165

M3 - Chapter

SN - 978-1-4673-9053-8

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EP - 82

BT - Proceedings of the 2016 International Conference for Students on Applied Engineering (ISCAE)

PB - IEEE

CY - Piscataway

ER -

An investigation into the effects of pattern geometries on laser trimmed film resistors

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Keywords

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