An investigative study of Manganese-based Antiperovskite structures as a thin film resistive material system

Research output: Other contribution


Novel manganese (Mn) based antiperovskite material systems have been reported to have Temperature Coefficient of Resistance (TCR) in the range of+ 0.09 to+ 46 ppm/C. Such extremely low values of TCR make these materials an ideal choice to replace existing thin film resistor systems like NiCr and TaN, which are reaching their current limit at±5 ppm/C. These ultra-precise passive components find use in applications such as medical diagnostics, industrial automation and military systems, where they must maintain a stable resistance value across an extreme temperature range of-55 to+ 155 C throughout their lifetime.
Original languageEnglish
TypePhD Thesis
Media of outputNorthumbria repository
Number of pages220
Publication statusPublished - 2018

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