Automatic Defect Identification of Eddy Current Pulsed Thermography Using Single Channel Blind Source Separation

Bin Gao, Libing Bai, Wai Lok Woo, Gui Yun Tian, Yuhua Cheng

Research output: Contribution to journalArticlepeer-review

110 Citations (Scopus)


Eddy current pulsed thermography (ECPT) is an emerging nondestructive testing and evaluation (NDT&E) technique and has been applied for a wide range of conductive materials. In this paper, a single-channel blind source separation is proposed to process the ECPT image sequences. The proposed method enables: 1) automatically extract valuable spatial and time patterns according to the whole transient response behavior without any training knowledge, 2) automatically identify defect patterns and quantify the defects, and 3) to provide guidelines of choosing the optimal contrast functions that can improve the separation results. In this paper, both mathematical and physical models are discussed and linked. The basis of the selection of separated spatial and time patterns is also presented. In addition, an artificial slot and a thermal fatigue natural crack are applied to validate the proposed method.
Original languageEnglish
Pages (from-to)913-922
JournalIEEE Transactions on Instrumentation and Measurement
Issue number4
Early online date4 Nov 2013
Publication statusPublished - Apr 2014

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