Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

Chris Jeynes, Guillaume Zoppi, Ian Forbes, Melanie Bailey, Nianhua Peng

Research output: Contribution to conferencePaperpeer-review

2 Citations (Scopus)

Abstract

There are many technical challenges in the fabrication of devices from novel materials. The characterization of these materials is critical in the development of efficient photovoltaic systems. We show how the application of recent advances in MeV IBA, providing the self-consistent treatment of RBS (Rutherford backscattering) and PIXE (particle induced X-ray emission) spectra, makes a new set of powerful complementary depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.
Original languageEnglish
DOIs
Publication statusPublished - Apr 2009
EventSupergen '09: International Conference on Sustainable Power Generation and Supply - Nanjing, China
Duration: 1 Apr 2009 → …

Conference

ConferenceSupergen '09: International Conference on Sustainable Power Generation and Supply
Period1/04/09 → …

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