Compact model based design space exploration for CMOS hall effect sensors

Ibrahim Kagan Aksoyak; Kaan Balaban; Hamdi Torun; Gunhan Dundar

doi:10.1109/SMACD.2017.7981591

Compact model based design space exploration for CMOS hall effect sensors

Ibrahim Kagan Aksoyak, Kaan Balaban, Hamdi Torun, Gunhan Dundar

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

This paper presents an analytical model for Hall Plates. The model includes the calculation of some key features such as Hall voltage, resolution, sensitivity, and signal-to-noise ratio (SNR) for different device geometries. The model is used to determine the device geometries for the best optimization parameters in the design of Hall plates. The model is validated with the measurements taken from a Hall Plate.

Original language	English
Title of host publication	SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781509050529
ISBN (Print)	9781509050536
DOIs	https://doi.org/10.1109/SMACD.2017.7981591
Publication status	Published - 17 Jul 2017
Externally published	Yes
Event	14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017 - Giardini Naxos, Taormina, Italy Duration: 12 Jun 2017 → 15 Jun 2017

Conference

Conference	14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017
Country/Territory	Italy
City	Giardini Naxos, Taormina
Period	12/06/17 → 15/06/17

Keywords

Hall plate
Hall voltage
resolution
sensitivity
signal to noise ratio

Access to Document

10.1109/SMACD.2017.7981591

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Aksoyak, I. K., Balaban, K., Torun, H., & Dundar, G. (2017). Compact model based design space exploration for CMOS hall effect sensors. In SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design Article 7981591 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SMACD.2017.7981591

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title = "Compact model based design space exploration for CMOS hall effect sensors",

abstract = "This paper presents an analytical model for Hall Plates. The model includes the calculation of some key features such as Hall voltage, resolution, sensitivity, and signal-to-noise ratio (SNR) for different device geometries. The model is used to determine the device geometries for the best optimization parameters in the design of Hall plates. The model is validated with the measurements taken from a Hall Plate.",

keywords = "Hall plate, Hall voltage, resolution, sensitivity, signal to noise ratio",

author = "Aksoyak, {Ibrahim Kagan} and Kaan Balaban and Hamdi Torun and Gunhan Dundar",

year = "2017",

month = jul,

day = "17",

doi = "10.1109/SMACD.2017.7981591",

language = "English",

isbn = "9781509050536",

booktitle = "SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017 ; Conference date: 12-06-2017 Through 15-06-2017",

}

Aksoyak, IK, Balaban, K, Torun, H & Dundar, G 2017, Compact model based design space exploration for CMOS hall effect sensors. in SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design., 7981591, Institute of Electrical and Electronics Engineers Inc., 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017, Giardini Naxos, Taormina, Italy, 12/06/17. https://doi.org/10.1109/SMACD.2017.7981591

Compact model based design space exploration for CMOS hall effect sensors. / Aksoyak, Ibrahim Kagan; Balaban, Kaan; Torun, Hamdi et al.
SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design. Institute of Electrical and Electronics Engineers Inc., 2017. 7981591.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Compact model based design space exploration for CMOS hall effect sensors

AU - Aksoyak, Ibrahim Kagan

AU - Balaban, Kaan

AU - Torun, Hamdi

AU - Dundar, Gunhan

PY - 2017/7/17

Y1 - 2017/7/17

N2 - This paper presents an analytical model for Hall Plates. The model includes the calculation of some key features such as Hall voltage, resolution, sensitivity, and signal-to-noise ratio (SNR) for different device geometries. The model is used to determine the device geometries for the best optimization parameters in the design of Hall plates. The model is validated with the measurements taken from a Hall Plate.

AB - This paper presents an analytical model for Hall Plates. The model includes the calculation of some key features such as Hall voltage, resolution, sensitivity, and signal-to-noise ratio (SNR) for different device geometries. The model is used to determine the device geometries for the best optimization parameters in the design of Hall plates. The model is validated with the measurements taken from a Hall Plate.

KW - Hall plate

KW - Hall voltage

KW - resolution

KW - sensitivity

KW - signal to noise ratio

U2 - 10.1109/SMACD.2017.7981591

DO - 10.1109/SMACD.2017.7981591

M3 - Conference contribution

AN - SCOPUS:85027509331

SN - 9781509050536

BT - SMACD 2017 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2017

Y2 - 12 June 2017 through 15 June 2017

ER -

Compact model based design space exploration for CMOS hall effect sensors

Abstract

Conference

Keywords

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