Conduction mechanisms in metal/self-assembled monolayer/metal junction

David Etor, Linzi E. Dodd, Claudio Balocco, David Wood

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The conduction mechanisms in metal-insulator-metal (MIM) junctions where the insulator consists of a self-assembled monolayer are investigated. Temperature dependence measurements from 2.5 to 300 K, show that the conduction is dominated by tunnelling only for temperatures below 20 K, while at higher temperatures surface-limited and bulk-limited mechanisms are observed. The experimental results are explained using a combination of direct (Simmons) tunnelling, Schottky emission, and Poole-Frenkel theory. Further insight is gained through numerical simulations based on the non-equilibrium Green-function formalism.
Original languageEnglish
Pages (from-to)808-811
JournalMicro and Nano Letters
Issue number7
Early online date7 Mar 2019
Publication statusPublished - 26 Jun 2019


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