Corrigendum: Atomic force microscopy analysis of surface topography of pure thin aluminum films (Materials Research Express (2018) 5 (046416) DOI: 10.1088/2053-1591/aabe1b)

Wehave noticed an error we made during the final submission of our article for production in figure 5, page 8 of our article published in Material Research Express (DOI: https://doi.org/10.1088/2053-1591/aabe1b).We have therefore provided the correct version of figure 5 in this corrigendum. The figure 5 currently appearing has a repetition of sub-figures a and b. (Figure Presented). The corrected figure 5 should include c and d sub-figures and should appear as follows; (Figure Presented).