Defect super-resolution algorithm based on infrared thermal imaging physical kernel

Shunyao Wu, Bin Gao*, Wai Lok Woo, Yongjie Yu, Yang Yang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Infrared thermal imaging technology has been adopted for its advantages such as fast detection response, non-contact testing, and applicability to various objects. When testing a target object, this technology presents temperature distribution information of the target object's surface in the form of an image, achieving visualization. However, due to limitations in the hardware system of the thermal imager and the noise generated during the detection process, the resolution of infrared images is relatively low, and the details of the image are not rich enough, leading to limitations in specific defect detection. In this study, a defect super-resolution algorithm based on infrared thermal imaging physical kernel is proposed. The imaging degradation factors of the infrared images are analyzed, and the modulation transfer function of the infrared thermal imaging system is used as the physical prior to generate the underlying blur kernel of the infrared images. The infrared images are then reconstructed using a super-resolution algorithm based on the blur kernel. Obtained experimental results have demonstrated that the proposed method significantly improves the defect detection rate and the overall image quality. The demo code will be updated soon in https://faculty.uestc.edu.cn/gaobin/zh_CN/lwcg/153392/list/index.htm.

Original languageEnglish
Article number103368
Pages (from-to)1-15
Number of pages15
JournalNDT and E International
Volume154
Early online date9 Apr 2025
DOIs
Publication statusE-pub ahead of print - 9 Apr 2025

Keywords

  • Defect detection
  • Infrared thermal imaging
  • Physical kernel
  • Super-resolution algorithm

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