Dependence of fractal characteristics on the scan size of atomic force microscopy (AFM) phase imaging of aluminum thin films

F.M. Mwema, E.T. Akinlabi, O.P. Oladijo

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Original language	Undefined/Unknown
Journal	Materials Today: Proceedings
DOIs	https://doi.org/10.1016/j.matpr.2020.02.316
Publication status	Published - Mar 2020

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title = "Dependence of fractal characteristics on the scan size of atomic force microscopy (AFM) phase imaging of aluminum thin films",

author = "F.M. Mwema and E.T. Akinlabi and O.P. Oladijo",

year = "2020",

month = mar,

doi = "10.1016/j.matpr.2020.02.316",

language = "Undefined/Unknown",

journal = "Materials Today: Proceedings",

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TY - JOUR

T1 - Dependence of fractal characteristics on the scan size of atomic force microscopy (AFM) phase imaging of aluminum thin films

AU - Mwema, F.M.

AU - Akinlabi, E.T.

AU - Oladijo, O.P.

PY - 2020/3

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UR - https://doi.org/10.1016/j.matpr.2020.02.316

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DO - 10.1016/j.matpr.2020.02.316

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SN - 2214-7853

JO - Materials Today: Proceedings

JF - Materials Today: Proceedings

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