Depth Profiling of Charging Effect of Si Nanocrystals Embedded in SiO2: A Study of Charge Diffusion among Si Nanocrystals

Yang Liu, Tu Pei Chen, C. Y. Ng, L. Ding, Sam Zhang, Yong Qing Fu, Steve Fung

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

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Engineering & Materials Science