Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures

Anotidaishe Moyo; Muhammad Wakil Shahzad; Stewart Smith; Jonathan Terry; Yoshio Mita; Joseph Lewis; Yifan Li

doi:10.1109/ICMTS59902.2024.10520253

Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures

Anotidaishe Moyo, Muhammad Wakil Shahzad, Stewart Smith, Jonathan Terry, Yoshio Mita, Joseph Lewis, Yifan Li^*

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Abstract

This paper examines the intricate dynamics of droplet impact on coplanar reverse electrowetting systems (CREW), specifically exploring how the electrode ratio and bias voltage interact to affect voltage generation. Employing a systematic experimental approach, we varied the electrode ratio and bias voltage to analyze their effects on the generated voltage during droplet impact. Our findings reveal significant dependencies between these parameters and the voltage output, shedding light on the underlying mechanisms governing energy harvesting efficiency in CREW systems. This research can inform better design strategies for improving energy conversion efficiency in various applications.

Original language	English
Title of host publication	2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
Place of Publication	Piscataway, US
Publisher	IEEE
Number of pages	5
ISBN (Electronic)	9798350329896
DOIs	https://doi.org/10.1109/ICMTS59902.2024.10520253
Publication status	Published - 10 May 2024
Event	36th International Conference on Microelectronic Test Structures - The University of Edinburgh, Edinburgh, United Kingdom Duration: 15 Apr 2024 → 18 Apr 2024 https://icmts.net/

Conference

Conference	36th International Conference on Microelectronic Test Structures
Abbreviated title	ICMTS 2024
Country/Territory	United Kingdom
City	Edinburgh
Period	15/04/24 → 18/04/24
Internet address	https://icmts.net/

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10.1109/ICMTS59902.2024.10520253

2024080468 (1)Accepted author manuscript, 438 KB

Cite this

@inproceedings{c2d1280aca3d4fdc8e4ba48ff964bfc6,

title = "Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures",

abstract = "This paper examines the intricate dynamics of droplet impact on coplanar reverse electrowetting systems (CREW), specifically exploring how the electrode ratio and bias voltage interact to affect voltage generation. Employing a systematic experimental approach, we varied the electrode ratio and bias voltage to analyze their effects on the generated voltage during droplet impact. Our findings reveal significant dependencies between these parameters and the voltage output, shedding light on the underlying mechanisms governing energy harvesting efficiency in CREW systems. This research can inform better design strategies for improving energy conversion efficiency in various applications.",

author = "Anotidaishe Moyo and Shahzad, \{Muhammad Wakil\} and Stewart Smith and Jonathan Terry and Yoshio Mita and Joseph Lewis and Yifan Li",

year = "2024",

month = may,

day = "10",

doi = "10.1109/ICMTS59902.2024.10520253",

language = "English",

booktitle = "2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)",

publisher = "IEEE",

address = "United States",

note = "36th International Conference on Microelectronic Test Structures, ICMTS 2024 ; Conference date: 15-04-2024 Through 18-04-2024",

url = "https://icmts.net/",

}

Moyo, A , Shahzad, MW, Smith, S, Terry, J, Mita, Y, Lewis, J & Li, Y 2024, Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures. in 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS). IEEE, Piscataway, US, 36th International Conference on Microelectronic Test Structures, Edinburgh, United Kingdom, 15/04/24. https://doi.org/10.1109/ICMTS59902.2024.10520253

Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures. / Moyo, Anotidaishe ; Shahzad, Muhammad Wakil; Smith, Stewart et al.
2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS). Piscataway, US: IEEE, 2024.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures

AU - Moyo, Anotidaishe

AU - Shahzad, Muhammad Wakil

AU - Smith, Stewart

AU - Terry, Jonathan

AU - Mita, Yoshio

AU - Lewis, Joseph

AU - Li, Yifan

PY - 2024/5/10

Y1 - 2024/5/10

N2 - This paper examines the intricate dynamics of droplet impact on coplanar reverse electrowetting systems (CREW), specifically exploring how the electrode ratio and bias voltage interact to affect voltage generation. Employing a systematic experimental approach, we varied the electrode ratio and bias voltage to analyze their effects on the generated voltage during droplet impact. Our findings reveal significant dependencies between these parameters and the voltage output, shedding light on the underlying mechanisms governing energy harvesting efficiency in CREW systems. This research can inform better design strategies for improving energy conversion efficiency in various applications.

AB - This paper examines the intricate dynamics of droplet impact on coplanar reverse electrowetting systems (CREW), specifically exploring how the electrode ratio and bias voltage interact to affect voltage generation. Employing a systematic experimental approach, we varied the electrode ratio and bias voltage to analyze their effects on the generated voltage during droplet impact. Our findings reveal significant dependencies between these parameters and the voltage output, shedding light on the underlying mechanisms governing energy harvesting efficiency in CREW systems. This research can inform better design strategies for improving energy conversion efficiency in various applications.

UR - https://www.scopus.com/pages/publications/85193524520

U2 - 10.1109/ICMTS59902.2024.10520253

DO - 10.1109/ICMTS59902.2024.10520253

M3 - Conference contribution

BT - 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)

PB - IEEE

CY - Piscataway, US

T2 - 36th International Conference on Microelectronic Test Structures

Y2 - 15 April 2024 through 18 April 2024

ER -

Droplet Impact Sensing with Low Noise Coplanar Reverse-Electrowetting Test Structures

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