Effect of annealing on the micromorphology and corrosion properties of Ti/SS thin films

Sahar Rezaee, Ali Arman, Stanislav Jurečka, Alireza Grayeli Korpi, Fredrick Mwema, Carlos Luna, Dinara Sobola*, Sławomir Kulesza, Reza Shakoury, Mirosław Bramowicz, Azin Ahmadpourian

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Abstract

Ti and TiN thin films were deposited by means of electron beam evaporation on stainless steel substrates, and subsequently annealed at different temperatures (650, 750 and 850 °C) in a nitrogen atmosphere. The surface morphology of the films studied by atomic force microscopy (AFM), was found to exhibit specific multifractal properties depending on the annealing temperature. It turned out that the width of the multifractal singularity spectra, f(α), decreased as the annealing temperature increased up to 750 °C, but it increased when the temperature was kept at 750 and 850 °C accompanied by the rapid development of the surface objects. The generalized fractal dimension followed a similar trend. On the other hand, the corrosion resistance of the specimens was studied bythe potentiodynamic polarization test in 3.5% NaCl solution at room temperature, observing improved corrosion protection of the films remarkably due to the presence of very thin titanium nitride outer layer.

Original languageEnglish
Article number106681
Number of pages8
JournalSuperlattices and Microstructures
Volume146
Early online date15 Aug 2020
DOIs
Publication statusPublished - 1 Oct 2020
Externally publishedYes

Keywords

  • AFM
  • Corrosion
  • Micromorphology
  • Polarization
  • Ti/SS thin Films

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