Electron irradiation effect on the reverse phase transformation temperatures in TiNi shape memory alloy thin films

Zhiguo Wang, Xiao-Tao Zu, Yong Qing Fu, Shengtao Zhu, L. M. Wang

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

In this work, Ti–Ni shape memory alloy thin films were irradiated by 1.7 MeV electron with three types of fluences: 4 × 1020, 7 × 1020 and 1 × 1021/m2. The influence of electron irradiation on the transformation behavior of the TiNi thin films were investigated by differential scanning calorimetry. The transformation temperatures As and Af shifted to higher temperature after electron irradiation, the martensite was stabilized. The electron irradiation effect can be easily eliminated by one thermal cycle. The shifts of the transformation temperatures can be explained from the change of potential energy barrier and coherency energy between parent phase and martensite after irradiation.
Original languageEnglish
Pages (from-to)337-342
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume227
Issue number3
DOIs
Publication statusPublished - Jan 2005

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