Elemental depth profiling of thin film chalcogenides using MeV ion beam analysis

Chris Jeynes; Guillaume Zoppi; Ian Forbes; Melanie Bailey; Nianhua Peng

Elemental depth profiling of thin film chalcogenides using MeV ion beam analysis

Chris Jeynes, Guillaume Zoppi, Ian Forbes, Melanie Bailey, Nianhua Peng

Research output: Contribution to conference › Paper › peer-review

Abstract

The comprehensive characterisation is one of many technical challenges in the fabrication of photovoltaic devices from novel materials. We show how the application of recent advances in MeV ion beam analysis, providing the selfconsistent treatment of Rutherford backscattering and particle induced X-ray emission spectra, makes a new set of powerful complementary elemental depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.

Original language	English
Publication status	Published - 2009
Event	5th Photovoltaic Science Applications and Technology (PVSAT-5) - Glyndŵr University, Wrexham, UK Duration: 1 May 2009 → … http://www.pvsat.org.uk/PVSAT-5%20_Programme_FINAL.pdf

Conference

Conference	5th Photovoltaic Science Applications and Technology (PVSAT-5)
Period	1/05/09 → …
Internet address	http://www.pvsat.org.uk/PVSAT-5%20_Programme_FINAL.pdf

Cite this

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title = "Elemental depth profiling of thin film chalcogenides using MeV ion beam analysis",

abstract = "The comprehensive characterisation is one of many technical challenges in the fabrication of photovoltaic devices from novel materials. We show how the application of recent advances in MeV ion beam analysis, providing the selfconsistent treatment of Rutherford backscattering and particle induced X-ray emission spectra, makes a new set of powerful complementary elemental depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.",

author = "Chris Jeynes and Guillaume Zoppi and Ian Forbes and Melanie Bailey and Nianhua Peng",

year = "2009",

language = "English",

note = "5th Photovoltaic Science Applications and Technology (PVSAT-5) ; Conference date: 01-05-2009",

url = "http://www.pvsat.org.uk/PVSAT-5\%20\_Programme\_FINAL.pdf",

}

TY - CONF

T1 - Elemental depth profiling of thin film chalcogenides using MeV ion beam analysis

AU - Jeynes, Chris

AU - Zoppi, Guillaume

AU - Forbes, Ian

AU - Bailey, Melanie

AU - Peng, Nianhua

PY - 2009

Y1 - 2009

N2 - The comprehensive characterisation is one of many technical challenges in the fabrication of photovoltaic devices from novel materials. We show how the application of recent advances in MeV ion beam analysis, providing the selfconsistent treatment of Rutherford backscattering and particle induced X-ray emission spectra, makes a new set of powerful complementary elemental depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.

AB - The comprehensive characterisation is one of many technical challenges in the fabrication of photovoltaic devices from novel materials. We show how the application of recent advances in MeV ion beam analysis, providing the selfconsistent treatment of Rutherford backscattering and particle induced X-ray emission spectra, makes a new set of powerful complementary elemental depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.

M3 - Paper

T2 - 5th Photovoltaic Science Applications and Technology (PVSAT-5)

Y2 - 1 May 2009

ER -

Elemental depth profiling of thin film chalcogenides using MeV ion beam analysis

Abstract

Conference

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