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In-situ Stress Monitoring with a Laser-Fibre System

Vincent Barrioz, Stuart Irvine, D. P. Jones

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    A novel laser-fibre system is used for in-situ stress monitoring of thin film deposition on a glass substrate. The authors have shown that it could also be used to monitor the temperature of the substrate, as well as the thickness of the growing layer, using the thin film interference equation. Single layers of ZnS and YF3 optical coatings have been evaporated onto borosilicate glass, doped with cerium oxide, in the environment of a high vacuum (HV) chamber. The results obtained show that the novel laser-fibre system used as a stress monitor can give insights into the causes of thin film residual stress in vacuum evaporation.
    Original languageEnglish
    Pages (from-to)550-554
    JournalAdvanced Engineering Materials
    Volume4
    Issue number8
    DOIs
    Publication statusPublished - Aug 2002

    Keywords

    • In-situ stress measurement
    • Laser-fibre system
    • Yttrium fluoride
    • Zinc sulfide

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