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In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films

Hong Wang, Guangai Sun, Xiaolin Wang, Bo Chen, Xiao-Tao Zu, Yanping Liu, Liangbin Li, Guoqiang Pan, Liusi Sheng, Yaoguang Liu, Yong Qing Fu

    Research output: Contribution to journal › Article › peer-review

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