In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films

Hong Wang, Guangai Sun, Bo Chen, Yong Qing Fu, Xiaolin Wang, Xiao-Tao Zu, Hua Hai Shen, Yanping Liu, Liangbin Li, Guoqiang Pan, Liusi Sheng, Q. Tian

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