In Situ Thin Film Stress Measurements – A Path to Understanding the Structure and Morphology of Electron Beam Evaporated ZnS

Physics

• Residual Stress 100%
• Substrates 13%
• Surface Roughness 13%
• Value 6%
• Thin Films 6%
• Deposition 6%
• Optical Properties 6%
• Electron Beams 6%
• Polycrystalline 6%

Engineering

• In Situ Stress 20%
• Deposition Rate 6%
• Electron-Beam Evaporation 6%
• Coating Industry 6%
• Preferred Orientation 6%
• Atomic Force Microscope 6%
• Fibre Laser System 6%
• Float Glass 6%
• Adhesion Layer 6%

Material Science

• In Situ Stress Measurement 20%
• Glass Type 6%
• Optical Coating 6%
• Stress Measurement 6%