Random capacitance modulation due to charging/discharging in Si nanocrystals embedded in gate dielectric

Yang Liu, Tu Pei Chen, C. Y. Ng, Man Siu Tse, P. Zhao, Yong Qing Fu, Sam Zhang, Steve Fung

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

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Engineering & Materials Science

Chemical Compounds