Single channel blind source separation for defect identification using Eddy Current Pulsed Thermography

Bin Gao, Libing Bai, W. L. Woo, Gui Yun Tian, Yuhua Cheng

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A single channel blind source separation is proposed to process the Eddy Current Pulsed Thermography (ECPT) image sequences. The proposed method enables the detection automatically extract valuable spatial and time patterns according to the whole transient response behavior without any training knowledge. In addition, it has the potential to automatically identify defect patterns and quantify the defects. In this study, both mathematical and physical models are discussed and linked. The basis of the selection of separated spatial and time patterns is also presented. In addition, a natural crack is applied to validate the proposed method.

Original languageEnglish
Title of host publicationFENDT 2013 - Proceedings of 2013 Far East Forum on Nondestructive Evaluation/Testing
Subtitle of host publicationNew Technology and Application
PublisherIEEE
Pages97-101
Number of pages5
ISBN (Electronic)9781467360203
ISBN (Print)9781467360180
DOIs
Publication statusPublished - 17 Oct 2013
Event2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology and Application, FENDT 2013 - Ji'nan, China
Duration: 17 Jun 201320 Jun 2013

Conference

Conference2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology and Application, FENDT 2013
CountryChina
CityJi'nan
Period17/06/1320/06/13

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