Structural and optical properties of layer-by-layer solution deposited Cu2SnS3 films

Devendra Tiwari, Tapas K. Chaudhuri, T. Shripathi, U. Deshpande, V. G. Sathe

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Abstract

Cu2SnS3 (CTS) is a simple and potential material for low-cost thin film solar cells. The present work incorporates the study of changes in structural and optical properties of layer-by-layer solution deposited CTS films with annealing. Raman spectroscopy is used to ascertain structural modification upon annealing. Increase in annealing temperature leads to a structural transition from tetragonal to cubic phase. Effect of annealing on optical properties of the films is evaluated in the wavelength range of 400–2,400 nm. It is proposed that layer-by-layer growth method fundamentally defines the optical behaviour of these films. Optical constants and parameters such as refractive indices, dielectric constants and electron energy loss function are calculated from transmittance and reflectance data. The refractive indices, n and k are determined to be in ranges of 1.8–2.2 and 0.18–1.2, respectively. The real and imaginary dielectric constants vary from 1.5 to 4.6 and 0.7 to 5, respectively. Dispersion of refractive index is analyzed using two different theoretical models of Wemple–diDomenico and Spitzer–Fan.
Original languageEnglish
Pages (from-to)3687-3694
JournalJournal of Materials Science: Materials in Electronics
Volume25
Issue number9
Early online date11 Jun 2014
DOIs
Publication statusPublished - 1 Sep 2014
Externally publishedYes

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