TY - JOUR
T1 - Structural and optical properties of layer-by-layer solution deposited Cu2SnS3 films
AU - Tiwari, Devendra
AU - Chaudhuri, Tapas K.
AU - Shripathi, T.
AU - Deshpande, U.
AU - Sathe, V. G.
N1 - Funding information:
The authors are grateful to the UGC-DAE Consortium for Scientific Research, Indore for funding under Collaborative Research Scheme (CSR-I/CRS-49/49).
PY - 2014/9/1
Y1 - 2014/9/1
N2 - Cu2SnS3 (CTS) is a simple and potential material for low-cost thin film solar cells. The present work incorporates the study of changes in structural and optical properties of layer-by-layer solution deposited CTS films with annealing. Raman spectroscopy is used to ascertain structural modification upon annealing. Increase in annealing temperature leads to a structural transition from tetragonal to cubic phase. Effect of annealing on optical properties of the films is evaluated in the wavelength range of 400–2,400 nm. It is proposed that layer-by-layer growth method fundamentally defines the optical behaviour of these films. Optical constants and parameters such as refractive indices, dielectric constants and electron energy loss function are calculated from transmittance and reflectance data. The refractive indices, n and k are determined to be in ranges of 1.8–2.2 and 0.18–1.2, respectively. The real and imaginary dielectric constants vary from 1.5 to 4.6 and 0.7 to 5, respectively. Dispersion of refractive index is analyzed using two different theoretical models of Wemple–diDomenico and Spitzer–Fan.
AB - Cu2SnS3 (CTS) is a simple and potential material for low-cost thin film solar cells. The present work incorporates the study of changes in structural and optical properties of layer-by-layer solution deposited CTS films with annealing. Raman spectroscopy is used to ascertain structural modification upon annealing. Increase in annealing temperature leads to a structural transition from tetragonal to cubic phase. Effect of annealing on optical properties of the films is evaluated in the wavelength range of 400–2,400 nm. It is proposed that layer-by-layer growth method fundamentally defines the optical behaviour of these films. Optical constants and parameters such as refractive indices, dielectric constants and electron energy loss function are calculated from transmittance and reflectance data. The refractive indices, n and k are determined to be in ranges of 1.8–2.2 and 0.18–1.2, respectively. The real and imaginary dielectric constants vary from 1.5 to 4.6 and 0.7 to 5, respectively. Dispersion of refractive index is analyzed using two different theoretical models of Wemple–diDomenico and Spitzer–Fan.
KW - Dielectric Constant
KW - Thin Film Solar Cell
KW - Energy Loss Function
KW - High Frequency Dielectric Constant
KW - Unannealed Film
UR - https://www.scopus.com/pages/publications/84905862462
U2 - 10.1007/s10854-014-2076-y
DO - 10.1007/s10854-014-2076-y
M3 - Article
SN - 0957-4522
VL - 25
SP - 3687
EP - 3694
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 9
ER -
