Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

Ilka Schmueser; Ewen Blair; Ziya Isiksacan; Yifan Li; Damion Corrigan; Adam Stokes; Jonathan Terry; Andrew Mount; Anthony Walton

doi:10.1109/ICMTS48187.2020.9107930

Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

Ilka Schmueser, Ewen Blair, Ziya Isiksacan, Yifan Li, Damion Corrigan, Adam Stokes, Jonathan Terry, Andrew Mount, Anthony Walton

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Abstract

This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.

Original language	English
Title of host publication	2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)
Place of Publication	Piscataway, NJ
Publisher	IEEE
Chapter	4.4
Number of pages	6
ISBN (Electronic)	9781728140087
DOIs	https://doi.org/10.1109/ICMTS48187.2020.9107930
Publication status	Published - May 2020
Event	2020 IEEE 33rd International Conference on Microelectronic Test Structures - Edinburgh, United Kingdom Duration: 4 May 2020 → 18 May 2020 https://ieeexplore.ieee.org/xpl/conhome/9104792/proceeding

Conference

Conference	2020 IEEE 33rd International Conference on Microelectronic Test Structures
Abbreviated title	IEEE ICMTS 2020
Country/Territory	United Kingdom
City	Edinburgh
Period	4/05/20 → 18/05/20
Internet address	https://ieeexplore.ieee.org/xpl/conhome/9104792/proceeding

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10.1109/ICMTS48187.2020.9107930

IEEE ICMTS 2020 YLiAccepted author manuscript, 2.47 MB

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Schmueser, I., Blair, E., Isiksacan, Z., Li, Y., Corrigan, D., Stokes, A., Terry, J., Mount, A., & Walton, A. (2020). Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. In 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) IEEE. https://doi.org/10.1109/ICMTS48187.2020.9107930

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title = "Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures",

abstract = "This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.",

author = "Ilka Schmueser and Ewen Blair and Ziya Isiksacan and Yifan Li and Damion Corrigan and Adam Stokes and Jonathan Terry and Andrew Mount and Anthony Walton",

year = "2020",

month = may,

doi = "10.1109/ICMTS48187.2020.9107930",

language = "English",

booktitle = "2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)",

publisher = "IEEE",

address = "United States",

note = "2020 IEEE 33rd International Conference on Microelectronic Test Structures , IEEE ICMTS 2020 ; Conference date: 04-05-2020 Through 18-05-2020",

url = "https://ieeexplore.ieee.org/xpl/conhome/9104792/proceeding",

}

Schmueser, I, Blair, E, Isiksacan, Z, Li, Y, Corrigan, D, Stokes, A, Terry, J, Mount, A & Walton, A 2020, Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. in 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). IEEE, Piscataway, NJ, 2020 IEEE 33rd International Conference on Microelectronic Test Structures , Edinburgh, United Kingdom, 4/05/20. https://doi.org/10.1109/ICMTS48187.2020.9107930

Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. / Schmueser, Ilka; Blair, Ewen; Isiksacan, Ziya et al.
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, 2020.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

AU - Schmueser, Ilka

AU - Blair, Ewen

AU - Isiksacan, Ziya

AU - Li, Yifan

AU - Corrigan, Damion

AU - Stokes, Adam

AU - Terry, Jonathan

AU - Mount, Andrew

AU - Walton, Anthony

PY - 2020/5

Y1 - 2020/5

N2 - This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.

AB - This paper presents a complete test structure and characterisation system for the evaluation of nanoelectrode technology. It integrates microfabricated nanoelectrodes for electrochemical measurements, 3D printing and surface tensionconfined microfluidics. This system exploits the inherent analytical advantages of nanoelectrodes that enables their operation with small volume samples, which has potential applications for onwafer measurements.

UR - https://www.scopus.com/pages/publications/85086477884

U2 - 10.1109/ICMTS48187.2020.9107930

DO - 10.1109/ICMTS48187.2020.9107930

M3 - Conference contribution

BT - 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS)

PB - IEEE

CY - Piscataway, NJ

T2 - 2020 IEEE 33rd International Conference on Microelectronic Test Structures

Y2 - 4 May 2020 through 18 May 2020

ER -

Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures

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