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Test structures and a measurement system for characterising the lifetime of EWOD devices
D. Gruber, Yifan Li, Stewart Smith, A. Tiwari, F. Deng, Adam Stokes, Jonathan Terry, A. Bunting, Logan Mackay, Pat Langridge-Smith
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review
2
Citations
(Scopus)