Test structures and a measurement system for characterising the lifetime of EWOD devices

D. Gruber, Yifan Li, Stewart Smith, A. Tiwari, F. Deng, Adam Stokes, Jonathan Terry, A. Bunting, Logan Mackay, Pat Langridge-Smith

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

2 Citations (Scopus)

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Engineering & Materials Science