Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics

Yifan Li, Yong Qing Fu, D. Winters, Brian Flynn, William Parkes, Douglas Brodie, Yufei Liu, Jonathan Terry, Les Haworth, Andrew Bunting, J. Stevenson, Stewart Smith, Logan Mackay, Pat Langridge-Smith, Adam Stokes, Anthony Walton