Testing linear macros in mixed-signal systems using transient response testing and dynamic supply current monitoring

Transient response testing (TRT) has been shown to be a powerful technique for the testing of linear macros in mixed-signal systems. Its most significant advantage is the ease with which the generic digital stimuli can be injected into, and propagated through, a mixed-signal system. However, with a deeply buried macro the resulting response is difficult to access, and these benefits cannot be fully exploited. The authors show how this problem can be overcome by forcing the transient response of interest to manifest itself in the device supply current, and also present a silicon efficient serial digital test access structure.