TY - JOUR
T1 - Thickness dependence of structure and optoelectronic properties of In2O3:Mo films prepared by spray pyrolysis
AU - Prathap, Pathi
AU - Revathi, Naidu
AU - Ramakrishna Reddy, Kotte
AU - Miles, Robert
PY - 2009
Y1 - 2009
N2 - The influence of thickness on the structural, morphological and optoelectronic behavior of Mo-doped In2O3 films, prepared by spray pyrolysis was investigated. The films had the cubic crystal structure for all the thicknesses investigated although it was found that a change in the preferred orientation and growth mode, from 2D to 3D, has occurred with an increase of film thickness. A small degradation in the optical transmittance has been observed with the increase of film thickness. The variation of electrical resistivity, mobility and charge carrier concentration with film thickness were also studied and the results discussed.
AB - The influence of thickness on the structural, morphological and optoelectronic behavior of Mo-doped In2O3 films, prepared by spray pyrolysis was investigated. The films had the cubic crystal structure for all the thicknesses investigated although it was found that a change in the preferred orientation and growth mode, from 2D to 3D, has occurred with an increase of film thickness. A small degradation in the optical transmittance has been observed with the increase of film thickness. The variation of electrical resistivity, mobility and charge carrier concentration with film thickness were also studied and the results discussed.
U2 - 10.1016/j.tsf.2009.01.188
DO - 10.1016/j.tsf.2009.01.188
M3 - Article
SN - 0040-6090
VL - 518
SP - 1271
EP - 1274
JO - Thin Solid Films
JF - Thin Solid Films
IS - 4
ER -