Thickness dependent optical properties of thermally evaporated SnS Thin Films

Patrick Nwofe; Kotte Ramakrishna Reddy; Kian Tan; Ian Forbes; Robert Miles

doi:10.1016/j.phpro.2012.03.064

Thickness dependent optical properties of thermally evaporated SnS Thin Films

Patrick Nwofe, Kotte Ramakrishna Reddy, Kian Tan, Ian Forbes, Robert Miles

Research output: Contribution to journal › Article › peer-review

Abstract

Thin films of tin sulphide (SnS) were prepared on glass substrates using the thermal evaporation method and the optical dispersion parameters investigated. The results obtained on the dispersion parameters and other optical constants indicated a strong thickness dependency. The results indicated that the refractive index data obeyed the single oscillator model. The dispersion energy (Ed), optical spectra moments (M-1) and (M-3) and the dielectric constant (ɛ) were all found to decrease with increase of film thicknesses. However, the oscillator energy (Eo) and angular frequency (ωp) are independent of film thickness. These results are useful tool for further understanding the electronic structure for this novel material.

Original language	English
Pages (from-to)	150-157
Journal	Physics Procedia
Volume	25
DOIs	https://doi.org/10.1016/j.phpro.2012.03.064
Publication status	Published - 2012

Keywords

thermal evaporation
SnS films
film thickness effect
optical properties

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10.1016/j.phpro.2012.03.064

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title = "Thickness dependent optical properties of thermally evaporated SnS Thin Films",

abstract = "Thin films of tin sulphide (SnS) were prepared on glass substrates using the thermal evaporation method and the optical dispersion parameters investigated. The results obtained on the dispersion parameters and other optical constants indicated a strong thickness dependency. The results indicated that the refractive index data obeyed the single oscillator model. The dispersion energy (Ed), optical spectra moments (M-1) and (M-3) and the dielectric constant (ɛ) were all found to decrease with increase of film thicknesses. However, the oscillator energy (Eo) and angular frequency (ωp) are independent of film thickness. These results are useful tool for further understanding the electronic structure for this novel material.",

keywords = "thermal evaporation, SnS films, film thickness effect, optical properties",

author = "Patrick Nwofe and {Ramakrishna Reddy}, Kotte and Kian Tan and Ian Forbes and Robert Miles",

year = "2012",

doi = "10.1016/j.phpro.2012.03.064",

language = "English",

volume = "25",

pages = "150--157",

journal = "Physics Procedia",

issn = "1875-3892",

publisher = "Elsevier",

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TY - JOUR

T1 - Thickness dependent optical properties of thermally evaporated SnS Thin Films

AU - Nwofe, Patrick

AU - Ramakrishna Reddy, Kotte

AU - Tan, Kian

AU - Forbes, Ian

AU - Miles, Robert

PY - 2012

Y1 - 2012

N2 - Thin films of tin sulphide (SnS) were prepared on glass substrates using the thermal evaporation method and the optical dispersion parameters investigated. The results obtained on the dispersion parameters and other optical constants indicated a strong thickness dependency. The results indicated that the refractive index data obeyed the single oscillator model. The dispersion energy (Ed), optical spectra moments (M-1) and (M-3) and the dielectric constant (ɛ) were all found to decrease with increase of film thicknesses. However, the oscillator energy (Eo) and angular frequency (ωp) are independent of film thickness. These results are useful tool for further understanding the electronic structure for this novel material.

AB - Thin films of tin sulphide (SnS) were prepared on glass substrates using the thermal evaporation method and the optical dispersion parameters investigated. The results obtained on the dispersion parameters and other optical constants indicated a strong thickness dependency. The results indicated that the refractive index data obeyed the single oscillator model. The dispersion energy (Ed), optical spectra moments (M-1) and (M-3) and the dielectric constant (ɛ) were all found to decrease with increase of film thicknesses. However, the oscillator energy (Eo) and angular frequency (ωp) are independent of film thickness. These results are useful tool for further understanding the electronic structure for this novel material.

KW - thermal evaporation

KW - SnS films

KW - film thickness effect

KW - optical properties

U2 - 10.1016/j.phpro.2012.03.064

DO - 10.1016/j.phpro.2012.03.064

M3 - Article

SN - 1875-3892

VL - 25

SP - 150

EP - 157

JO - Physics Procedia

JF - Physics Procedia

ER -

Thickness dependent optical properties of thermally evaporated SnS Thin Films

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Keywords

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