TY - JOUR
T1 - Toughness measurement of thin films: a critical review
AU - Zhang, Sam
AU - Sun, Deen
AU - Fu, Yong Qing
AU - Du, Hejun
PY - 2005/8/1
Y1 - 2005/8/1
N2 - At present, there is neither standard test procedure nor standard methodology for assessment of toughness of thin films. However, researchers have long been trying to make such measurements, thus a spectrum of test methods have been developed, mostly each in its own way. As qualitative or semiquantitative assessment, a simple plasticity measurement or scratch adhesion test can mostly suffice. For quantitative description, however, a choice of bending, buckling, indentation, scratching, or tensile test has to be made. These testing methods are either stress-based or energy-based. This paper gives a critical review on these methods and concludes that, for thin films, the energy-based approach, especially the one independent of substrate, is more advantageous.
AB - At present, there is neither standard test procedure nor standard methodology for assessment of toughness of thin films. However, researchers have long been trying to make such measurements, thus a spectrum of test methods have been developed, mostly each in its own way. As qualitative or semiquantitative assessment, a simple plasticity measurement or scratch adhesion test can mostly suffice. For quantitative description, however, a choice of bending, buckling, indentation, scratching, or tensile test has to be made. These testing methods are either stress-based or energy-based. This paper gives a critical review on these methods and concludes that, for thin films, the energy-based approach, especially the one independent of substrate, is more advantageous.
KW - Toughness
KW - Toughness measurement
KW - Thin films
KW - Coatings
U2 - 10.1016/j.surfcoat.2004.10.021
DO - 10.1016/j.surfcoat.2004.10.021
M3 - Article
VL - 198
SP - 74
EP - 84
JO - Surface and Coatings Technology
JF - Surface and Coatings Technology
SN - 0257-8972
IS - 1-3
ER -