TY - GEN
T1 - Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering
AU - Mwema, Fredrick M.
AU - Akinlabi, Esther T.
AU - Oladijo, Oluseyi P.
N1 - Funding Information:
The authors of this article would like to acknowledge University Research Committee (URC), University of Johannesburg, South Africa for sponsoring the PhD candidate working on magnetron sputtering of thin films. Mr. Maphane of Botswana International University of Science & Technology (BIUST), Botswana and MMU staff at the University of Witwatersrand (Wits), South Africa are also acknowledged for assisting on Magnetron sputtering and AFM/FESEM facilities respectively.
Publisher Copyright:
© 2020, Springer Nature Singapore Pte Ltd.
PY - 2020
Y1 - 2020
N2 - The purpose of this article is to illustrate the use of two-dimensional fast Fourier transform (2D-FFT) algorithm to describe the properties of aluminium thin films. To do so, the microstructures of thin Al films deposited on stainless steel substrates though radio-frequency (RF) magnetron sputtering are analysed using two-dimensional fast Fourier transform (2D-FFT) algorithm. Field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) images obtained on the surfaces of the films are taken through different image analysis processes. The power spectra are described in terms of spatial frequencies, wavelengths and light intensities in the reciprocal space for both SEM and AFM images. The results of power spectra obtained from FESEM and AFM micrographs are compared for two different cases-films deposited at 200 and 300 W at the same substrate temperature (100 °C). We observe that the 2D-FFT analysis of both SEM and AFM methods can describe (in more details) the distribution of surface structures in thin aluminium films.
AB - The purpose of this article is to illustrate the use of two-dimensional fast Fourier transform (2D-FFT) algorithm to describe the properties of aluminium thin films. To do so, the microstructures of thin Al films deposited on stainless steel substrates though radio-frequency (RF) magnetron sputtering are analysed using two-dimensional fast Fourier transform (2D-FFT) algorithm. Field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) images obtained on the surfaces of the films are taken through different image analysis processes. The power spectra are described in terms of spatial frequencies, wavelengths and light intensities in the reciprocal space for both SEM and AFM images. The results of power spectra obtained from FESEM and AFM micrographs are compared for two different cases-films deposited at 200 and 300 W at the same substrate temperature (100 °C). We observe that the 2D-FFT analysis of both SEM and AFM methods can describe (in more details) the distribution of surface structures in thin aluminium films.
KW - Aluminium thin films
KW - Atomic force microscopy (AFM)
KW - Fast Fourier transform (FFT)
KW - Field emission electron microscopy (FESEM)
KW - Image analysis
KW - Sputtering
UR - http://www.scopus.com/inward/record.url?scp=85075711468&partnerID=8YFLogxK
U2 - 10.1007/978-981-13-8297-0_27
DO - 10.1007/978-981-13-8297-0_27
M3 - Conference contribution
AN - SCOPUS:85075711468
SN - 9789811382963
T3 - Lecture Notes in Mechanical Engineering
SP - 239
EP - 249
BT - Advances in Material Sciences and Engineering, ICMMPE 2018
A2 - Awang, Mokhtar
A2 - Emamian, Seyed Sattar
A2 - Yusof, Farazila
PB - Springer
T2 - 4th International Conference on Mechanical, Manufacturing and Plant Engineering, ICMMPE 2018
Y2 - 14 November 2018 through 15 November 2018
ER -