well with observations, with higher errors for snow with predominantly vertical structures. For simulation of brightness temperature, difficulty in retrieving stickiness with the Sticky Hard Sphere microstructure model resulted in relatively poor performance for two experiments, but good agreement for the third. Exponential microstructure gave generally good results, near to the best performing models for two field experiments. The Independent Sphere model gave intermediate results. New Teubner-Strey and Gaussian Random Field models demonstrated advantages of SMRT over microwave models with restricted microstructural geometry. Relative model performance are assessed by the quality of the microstructure model fit to micro-CT data and further improvements may be possible with different fitting techniques. Careful consideration of simulation stratigraphy is required in this new era of high-resolution microstructure measurement as layers thinner than the wavelength introduce artificial scattering boundaries not seen by the instrument.
|Number of pages||17|
|Journal||IEEE Transactions on Geoscience and Remote Sensing|
|Publication status||Accepted/In press - 17 May 2021|