Abstract
SAW devices were fabricated on c-axis oriented ZnO films grown on Si substrates. Effects of film thickness on the film microstructure and acoustic frequencies were studied. Both Rayleigh and Sezawa mode waves were detected on the devices, and their resonant frequencies were found to decrease with increase in film thickness.
Original language | English |
---|---|
Pages | 1365-1368 |
Number of pages | 4 |
Publication status | Published - 1 Dec 2007 |
Externally published | Yes |
Event | 14th International Display Workshops, IDW '07 - Sapporo, Japan Duration: 5 Dec 2007 → 5 Dec 2007 |
Conference
Conference | 14th International Display Workshops, IDW '07 |
---|---|
Country/Territory | Japan |
City | Sapporo |
Period | 5/12/07 → 5/12/07 |